Column-matching based mixed-mode test pattern generator design technique for BIST
نویسندگان
چکیده
منابع مشابه
Column-matching based mixed-mode test pattern generator design technique for BIST
A novel test-per-clock built-in self-test (BIST) equipment design method for combinational or full-scan sequential circuits is proposed in this paper. Particularly, the test pattern generator is being designed. The method is based on similar principles as are well known test pattern generator design methods, like bit-fixing and bit-flipping. The novelty comprises in proposing a brand new algori...
متن کاملColumn-matching Based Mixed-mode Bist Technique
A novel test-per-clock built-in self-test (BIST) equipment design method for combinational or full-scan circuits, together with necessary supplementary algorithms, is proposed in this Thesis. This method is mostly based on a design of a combinational block the Decoder, transforming pseudo-random code words into deterministic test patterns pre-computed by some ATPG tool. The Column-Matching algo...
متن کاملMixed-mode Bist Based on Column Matching
A test-per-clock BIST method for combinational or full-scan circuits is proposed. The method is based on a design of a combinational block the decoder, transforming pseudo-random LFSR code words into deterministic test patterns. A Column-Matching algorithm to design the decoder is proposed. The Column-Matching method modified to support a mixed-mode BIST is proposed as well. Here the BIST is di...
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In Built-In Self-Test (BIST), test patterns are generated and applied to the circuit-under-test (CUT) by on-chip hardware; minimizing hardware overhead is a major concern of BIST implementation. In pseudorandom BIST architectures, the test patterns are generated in random nature by Linear Feedback Shift Registers (LFSR). Conventional LFSRs normally requires more number of test patterns for test...
متن کاملColumn-Matching Based BIST Design Method
A new method of test-per-clock BIST design for combinational circuits is proposed. The fundamental problem of matching the PRPG outputs with the required test patterns is solved as a general design problem in the field of combinational logic. A test set generated by an ATPG is compared with the PRPG generated sequence. The solution is based on a novel search algorithm, which identifies the best...
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ژورنال
عنوان ژورنال: Microprocessors and Microsystems
سال: 2008
ISSN: 0141-9331
DOI: 10.1016/j.micpro.2008.03.004